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Optimize 5G US mmWave 3D EIS Scan Test Times with Machine Leaning Software (MX800010A-026)
Anritsu’s MT8000A plus MA8172A support 3GPP tests of antenna properties at all positions for mmWave UE development.
2:03
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RF Measurements for NB-IoT in Non-Terrestrial Networks Challenges and Solutions
Anritsu's RF Testing for NTN NB-IoT Challenges
3:53
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IP Data Throughput Test Solution for 5G Devices: Part 2 Demonstration
This video explains Anritsu's IP data throughput testing solution for 5G devices.
9:01
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IP Data Throughput Test Solution for 5G Devices Part 1 Product Introduction
This video explains Anritsu's IP data throughput testing solution for 5G devices.
7:43
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Automated Valet Parking Simulation
This video explains the required test solutions to improve Type-2 AVP reliability.
3:59
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MT8000A 5G Base Station Manufacturing Test Solution
MT8000A is the ideal non-signaling RF test solution for the manufacturing of 5G Base Stations.
3:48
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Optimal Call Box for RF Regulatory OTA/SAR/EMC Test
Regulatory test is performed while maintaining a call connection of DUT with a call box in high-loss OTA environments.
5:00
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3GPP RF Test Solution beginning from Minimum Configuration
Introduction of MT8000A minimum configuration and expandability and demo of 3GPP RF measurement
5:25
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Efficient Ways to RF Test Your IoT Device
This webinar will focus on conducting RF measurements for an IoT device using network simulators, and includes 5G, LTE, NB-IoT, Cat-M, wireless LAN (WLAN), V2X, Bluetooth and Zigbee
59:59
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Anritsu 5G Solutions
Anritsu's Extensive Product Line and Experience Lead in 5G
2:22
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5G Testing Anritsu
5G, 4G and 3G test Always with ANRITSU. Anritsu offers 5G measurement solutions supporting 5G innovation based on the company’s deep technical knowledge and experience in wireless and wired markets. Anritsu 5G measurement solutions will support your
1:44
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IoT: Smart Manufacturing
Multiple technologies – including Bluetooth, Cellular, and Wi-Fi – are used in smart manufacturing environments. In this video learn how to ensure compatibility and device performance in rugged environments using Anritsu test solutions.
3:34
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