As data rates are going higher, more and more modulation bandwidth is required for supporting high speed data application. Technologies like beyond 5G and 6G uses extreme high frequency signals (D and G bands) to support applications like artificial intelligence, machine learning and cloud computing. It is very important to characterize the fundamental components like diodes and transistors, by having a device modeling done at its best. A broadband VNA to 220 GHz is required for supporting such testing which Anritsu's ME7838G system provides. The solutions that are available today, only supports banded measurements which have measurement accuracy, repeatability and calibration stability issues. If the devices are not modeled correctly, the end device will have problems and issues.