True RCS Bi-static Measurements (RIS) Using Anritsu PhaseLync™ Technology at IMS 2025
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This video showcases the Anritsu PhaseLync ME7869A two-port VNA conducting a true radar cross section (RCS) bi-static measurement of a reflective intelligent surface (RIS) from our partner, Japan Display Inc. (JDI), demonstrated at IMS 2025. The demonstration illustrates a short-range measurement but also notes that the measurement can be conducted and has been tested to distances up to 100 meters. Anritsu PhaseLync technology is the first that allows modular VNA measurement ports to be separated from a contained VNA measurement system and solves stability issues presented with long RF cable runs.