Anritsu Device Characterization Services and Testing Facility 70 kHz to 220 GHz and beyond
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With technology moving toward higher frequencies such as D and G band, and devices becoming smaller in size, testing and characterizing on-wafer high frequency devices has always proven to be a challenge for customers. It is not always easy to have access to a 220 GHz or higher system for testing prototype and pilot designs by customers. To overcome this challenge of testing, Anritsu Company has introduced a testing service where customers can visit the Morgan Hill factory with their devices and make use of the testing service where we have a fully equipped lab, including 220 GHz VNAs, higher frequency modules, probe stations, probes of different pitches, power supplies, and various other components like 170 GHz spectrum analyzers.